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APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL Q4

期刊收录：
SCIE
Scopus

基本信息

期刊ISSN：
1054-4887
期刊简拼：
APPL COMPUT ELECTROM
年发文章数：
100
E-ISSN：
Gold OA文章占比
1.58%
研究文章占比：
100.00%
是否OA：
No
Jcr分区：
Q4
中科院分区：
4区

出版信息

出版商：
Applied Computational Electromagnetics Society (ACES)
涉及研究方向：
工程技术-电信学
出版国家：
UNITED STATES
出版语言：
English
出版周期：
Bimonthly
出版年份：

2023-2024最新影响因子:0.6
自引率:16.70%
五年影响因子:0.5
JCI期刊引文指标:0.14
h-index:26
CiteScore:1.60

期刊关键词

4区 SCIE Scopus 计算机科学 ENGINEERING ELECTRICAL & ELECTRONIC 工程：电子与电气 TELECOMMUNICATIONS 电信学

期刊简介

The ACES Journal is devoted to the exchange of information in computational electromagnetics, to the advancement of the state of the art, and to the promotion of related technical activities. A primary objective of the information exchange is the elimination of the need to "re-invent the wheel" to solve a previously solved computational problem in electrical engineering, physics, or related fields of study.

The ACES Journal welcomes original, previously unpublished papers, relating to applied computational electromagnetics. All papers are refereed.

A unique feature of ACES Journal is the publication of unsuccessful efforts in applied computational electromagnetics. Publication of such material provides a means to discuss problem areas in electromagnetic modeling. Manuscripts representing an unsuccessful application or negative result in computational electromagnetics is considered for publication only if a reasonable expectation of success (and a reasonable effort) are reflected.

The technical activities promoted by this publication include code validation, performance analysis, and input/output standardization; code or technique optimization and error minimization; innovations in solution technique or in data input/output; identification of new applications for electromagnetics modeling codes and techniques; integration of computational electromagnetics techniques with new computer architectures; and correlation of computational parameters with physical mechanisms.

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期刊简写：APPL COMPUT ELECTROM

此期刊被最新的JCR期刊SCIE收录