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MICROELECTRONICS RELIABILITY Q3

期刊收录：
SCIE
Scopus

基本信息

期刊ISSN：
0026-2714
期刊简拼：
MICROELECTRON RELIAB
年发文章数：
310
E-ISSN：
Gold OA文章占比
14.36%
研究文章占比：
98.39%
是否OA：
No
Jcr分区：
Q3
中科院分区：
4区

出版信息

出版商：
Elsevier Ltd
涉及研究方向：
工程技术-工程：电子与电气
出版国家：
ENGLAND
出版语言：
English
出版周期：
Monthly
出版年份：
1964

2023-2024最新影响因子:1.6
自引率:12.50%
五年影响因子:1.6
JCI期刊引文指标:0.3
h-index:80
CiteScore:3.30

期刊关键词

3区 SCIE Scopus 工程技术 4区 ENGINEERING ELECTRICAL & ELECTRONIC 工程：电子与电气 NANOSCIENCE & NANOTECHNOLOGY 纳米科技 PHYSICS APPLIED 物理：应用

期刊简介

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

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期刊简写：MICROELECTRON RELIAB

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