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MICRON Q1

期刊收录：
SCIE
Scopus

基本信息

期刊ISSN：
0968-4328
期刊简拼：
MICRON
年发文章数：
91
E-ISSN：
1878-4291
Gold OA文章占比
19.27%
研究文章占比：
98.90%
是否OA：
No
Jcr分区：
Q1
中科院分区：
3区

出版信息

出版商：
Elsevier Ltd
涉及研究方向：
工程技术-显微镜技术
出版国家：
ENGLAND
出版语言：
English
出版周期：
Bimonthly
出版年份：
1993

2023-2024最新影响因子:2.5
自引率:4.00%
五年影响因子:2.2
JCI期刊引文指标:1.14
h-index:75
CiteScore:4.30

期刊关键词

1区 SCIE Scopus 工程技术 3区 MICROSCOPY 显微镜技术

期刊简介

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.

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期刊简写：MICRON

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