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IEEE Design & Test Q3

期刊收录：
SCIE
Scopus

基本信息

期刊ISSN：
2168-2356
期刊简拼：
IEEE DES TEST
年发文章数：
59
E-ISSN：
Gold OA文章占比
6.08%
研究文章占比：
100.00%
是否OA：
No
Jcr分区：
Q3
中科院分区：
4区

出版信息

出版商：
IEEE Computer Society
涉及研究方向：
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
出版国家：
UNITED STATES
出版语言：
English
出版周期：
出版年份：

2023-2024最新影响因子:1.9
自引率:0.00%
五年影响因子:1.9
JCI期刊引文指标:0.44
h-index:72
CiteScore:3.80

期刊关键词

3区 SCIE Scopus 工程技术 4区 COMPUTER SCIENCE HARDWARE & ARCHITECTURE 计算机：硬件 ENGINEERING ELECTRICAL & ELECTRONIC 工程：电子与电气

期刊简介

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《IEEE Design & Test》期刊已被查看：次
期刊简写：IEEE DES TEST

此期刊被最新的JCR期刊SCIE收录