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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Q4

期刊收录：
SCIE
Scopus

基本信息

期刊ISSN：
0923-8174
期刊简拼：
J ELECTRON TEST
年发文章数：
43
E-ISSN：
1573-0727
Gold OA文章占比
9.56%
研究文章占比：
100.00%
是否OA：
No
Jcr分区：
Q4
中科院分区：
4区

出版信息

出版商：
Springer US
涉及研究方向：
工程技术-工程：电子与电气
出版国家：
UNITED STATES
出版语言：
English
出版周期：
Bimonthly
出版年份：
1990

2023-2024最新影响因子:1.1
自引率:18.20%
五年影响因子:0.9
JCI期刊引文指标:0.23
h-index:31
CiteScore:2.00

期刊关键词

4区 SCIE Scopus 工程技术 ENGINEERING ELECTRICAL & ELECTRONIC 工程：电子与电气

期刊简介

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement